on front Gallium-Arsenide, ICP Etch (Versaline) |
|
Process characteristics: |
Depth |
|
Batch size |
25 |
Etch rate |
1.6 µm/min |
Material |
gallium arsenide |
Sides processed |
either |
Temperature |
25 °C |
Wafer size |
|
Equipment |
VLR 700 Cluster -Chlorine Etch Chamber |
Equipment characteristics: |
Wafer geometry Types of wafers this equipment can accept |
1-flat |
Wafer holder Device that holds the wafers during processing. |
cassette |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
quartz (fused silica), gallium phosphide, indium phosphide, gallium arsenide, silicon |
Wafer thickness List or range of wafer thicknesses the tool can accept |
200 .. 700 µm |