Process Hierarchy

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368
on front
  Cleanliness measurement
Process characteristics:
Materials
Surface materials to inspect cleanliness on.
Materials
Available  
Selected
Surface materials to inspect cleanliness on.
Sides inspected
The sides of the wafer inspected by the process
 either
Equipment