Process Hierarchy

If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at engineering@mems-exchange.org or call us at (703) 262-5368
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  Particle count
Process characteristics:
Particle size
Specify the size of the smallest particle to count.
Particle size
Specify the size of the smallest particle to count.
unconstrained
Sides inspected
The sides of the wafer inspected by the process
 either
Equipment