on front Silicon RIE (smooth sidewalls) |
|
Process characteristics: |
Depth |
|
Etch rate |
1 µm/min |
Etch type |
dry anisotropic |
Material |
silicon |
Selectivity Primary material removal rate divided by removal rates of secondary materials (i.e., factors by which primary material is removed faster than secondary materials) |
photoresist (category): 3, silicon dioxide: 20 |
Sides processed |
either |
Wafer size |
|
Equipment |
Applied Materials Centura 5200 etcher |
Equipment characteristics: |
Batch sizes |
100 mm: 1, 150 mm: 1 |
MOS clean |
no |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
Pyrex (Corning 7740), silicon on insulator, silicon, fused silica |
Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 1000 µm |
Comments: |
|
Extra terms |
No materials with Gold contamination will be processed at this fab site. Certain services (for example, oxidation, diffusion, and sputter deposition) will be provided if wafers are virgin, or all pre-processing steps have been performed at this fab site. |