Aluminum Nitride (AlN) Sputter Deposition |
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Process characteristics: |
Thickness |
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Material |
aluminum nitride |
Temperature |
500 °C |
Wafer size |
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Equipment |
Unaxis CLC 200 |
Equipment characteristics: |
Batch sizes |
100 mm: 25, 150 mm: 25 |
MOS clean |
no |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat, no-flat |
Wafer holder Device that holds the wafers during processing. |
aluminum chuck |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
PZT, silicon |
Wafer thickness List or range of wafer thicknesses the tool can accept |
200 .. 600 µm |