on front Diamond CVD (smooth) |
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Process characteristics: |
Thickness Amount of material added to a wafer |
|
Coeffient of Thermal Expansion (CTE) @300K 1atm |
1.5e-06 1/°C |
Deposition rate Rate at which material is added to a wafer |
0.3 µm/hour |
Excluded materials |
gallium arsenide, gold (category), copper |
Material |
diamond |
Microstructure |
polycrystalline |
Pressure Pressure of process chamber during processing |
5 Torr |
Resistivity |
1e+13 Ω*cm |
Sides processed |
either |
Temperature |
725 °C |
Uniformity |
-10 .. 10 |
Young's Modulus |
1e+06 .. 1.2e+06 MPa |
Wafer size |
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Equipment |
Model 650 Hot-Filament Diamond Deposition System
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Equipment characteristics: |
Batch sizes |
100 mm: 9, 150 mm: 4, 200 mm: 1, 300 mm: 1 |
Wafer geometry Types of wafers this equipment can accept |
1-flat, 2-flat, notched, no-flat |
Wafer materials List of wafer materials this tool can accept (not list of all materials, just the wafer itself). |
silicon on insulator, silicon |
Wafer thickness List or range of wafer thicknesses the tool can accept |
300 .. 2000 µm |
Comments: |
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