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Undoped amorphous silicon LPCVD: View
Process Hierarchy
Bonding
Clean
Consulting
Deposition
Evaporation
LPCVD
Low-stress SiN deposition
Miscellaneous deposition
Oxidation
PECVD
Spin casting
Sputtering
Doping
Etch
LIGA
Lift off
Lithography
Mask making
Metrology
Miscellaneous
Packaging
Polishing
Process technologies
Thermal
Unique capabilities
If you are interested in this process, either by itself or as part of a longer processing sequence, please send us email at
engineering@mems-exchange.org
or call us at (703) 262-5368
Undoped amorphous silicon LPCVD
Process characteristics:
Thickness
Amount of material added to a wafer
Thickness
*
µm
nm
Amount of material added to a wafer, must be 0 .. 2 µm
0 .. 2 µm
Deposition rate
Rate at which material is added to a wafer
35 .. 50 Å/min
Excluded materials
gold, Borofloat (Schott), Pyrex (Corning 7740)
Material
amorphous silicon
Pressure
Pressure of process chamber during processing
300 mTorr
Sides processed
both
Temperature
580 °C
Wafer size
Wafer size
100 mm
150 mm
Equipment
Tylan/Tystar Furnaces (undoped polysilicon tube)
Equipment characteristics:
Batch sizes
100 mm: 24, 150 mm: 9
Wafer geometry
Types of wafers this equipment can accept
1-flat, 2-flat
Wafer holder
Device that holds the wafers during processing.
fused silica boat
Wafer materials
List of wafer materials this tool can accept (not list of all materials, just the wafer itself).
silicon
Wafer thickness
List or range of wafer thicknesses the tool can accept
300 .. 1500 µm
Comments:
Glass wafers are NOT allowed!